The structure of real materials using x-ray and neutron scattering

Atomic and magnetic long-range order can be elucidated crystallographically from single crystals and powders. Uses of powder diffraction will be described in the next section. Short-range atomic order is obtained from diffuse scattering data from single crystals, powders, liquids and amorphous materials and developments in this area will also be described. There are many other applications which cannot be described in detail for lack of space. Surfaces can be studied using reflectometry [l,Z**] and grazing incidence diffraction [3’,4]. Increasingly, in-plane features such as surface roughness are being studied by analyzing off-specular scattering in these experiments (5,6]. Chemical impurities on surfaces are detected by grazing incidence-angle fluorescence spectroscopy with femtogram sensitivity [7,8]. The precise location of these impurities on, and below, the surface can also be deduced from normal incidence x-ray standing wave analysis [3’]. Large-scale structures can be studied using small-angle scattering [PI.